Structural stabilization and ionic conductivity of bismuth niobium oxide films with fluorite-like structure


Por: Depablos-Rivera, Osmary, Rodil, Sandra E.

Publicada: 1 ene 2020
Resumen:
High ionic conductivity Nb-doped fluorite-like d-Bi2O3 films were produced using confocal magnetron sputtering. The structural stability of the films was evaluated by high-temperature X-ray diffraction showing that the films were stable up to 400 °C. The ionic contribution to the total electrical conductivity was demonstrated since the AC-conductivities were three orders of magnitude larger than DC-values. The un-doped d-Bi2O3 film presents high ionic conductivity, but it is lost above 200 °C due to structural changes. Meanwhile, the 5.1 at.% of Nb presented ionic conductivity (2.7 × 10-2 S cm-1) larger than other ionic conductors and was stable from room temperature to 400 °C. © 2020 Elsevier B.V.

Filiaciones:
Depablos-Rivera, Osmary:
 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n, Ciudad Universitaria, Ciudad de México, 04510, Mexico

 Univ Nacl Autonoma Mexico, Inst Invest Mat, Circuito Exterior S-N, Ciudad De Mexico 04510, Mexico

Rodil, Sandra E.:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Circuito Exterior S-N, Ciudad De Mexico 04510, Mexico

 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n, Ciudad Universitaria, Ciudad de México, 04510, Mexico
ISSN: 0167577X
Editorial
ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, Países Bajos
Tipo de documento: Article
Volumen: 267 Número:
Páginas:
WOS Id: 000520048600022

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