Synthesis of Bi 2 SiO 5 thin films by confocal dual magnetron sputtering-annealing route
Por:
Depablos-Rivera, O., Bouyanfif, H., Zeinert, A., Le Marrec, F., Rodil, S. E.
Publicada:
1 ene 2019
Resumen:
Synthesis of nanocrystalline Bi 2 SiO 5 thin films was achieved using confocal magnetron sputtering from independently driven alpha-Bi 2 O 3 and Si targets. The correct composition was obtained by adjusting the power applied to each target, but crystallization was obtained after annealing the samples in air at 400 °C for 2 h. The films were systematically characterized by grazing angle X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared and Raman spectroscopy and UV-VIS transmittance and reflectance spectroscopies. The XPS analysis of the annealed samples, indicated that the correct Bi 2 SiO 5 composition was obtained for the samples deposited using 80 W applied to the Si target, meanwhile the XRD results indicated the formation of randomly oriented nanocrystalline films, independently of the substrate used. Contrary to the commonly reported orthorhombic Bi 2 SiO 5 phase, the detailed analysis of the Raman spectra suggested that the films presented the monoclinic structure, which is only slightly different to the orthorhombic phase due to the small titling of the beta angle. The optical analysis indicated a direct optical band gap of 3.8 eV, although the films were not transparent due to the light scattering produced by a rough-porous surface. © 2019 Elsevier B.V.
Filiaciones:
Depablos-Rivera, O.:
Instituto de Ciencias Aplicadas y Tecnología, Universidad Nacional Autonoma de Mexico, Circuito Exterior s/n, CU, México D.F., 04510, Mexico
Univ Nacl Autonoma Mexico, Inst Ciencias Aplicadas & Tecnol, Circuito Exterior S-N, Mexico City 04510, DF, Mexico
Bouyanfif, H.:
Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, Amiens, 80039, France
Univ Picardie Jules Verne, Lab Phys Matiere Condensee, 33 Rue St Leu, F-80039 Amiens, France
Zeinert, A.:
Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, Amiens, 80039, France
Univ Picardie Jules Verne, Lab Phys Matiere Condensee, 33 Rue St Leu, F-80039 Amiens, France
Le Marrec, F.:
Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, Amiens, 80039, France
Univ Picardie Jules Verne, Lab Phys Matiere Condensee, 33 Rue St Leu, F-80039 Amiens, France
Rodil, S. E.:
Instituto de Investigaciones en Materiales, Universidad Nacional Autonoma de Mexico, Circuito Exterior s/n, CU, México D.F., 04510, Mexico
Univ Nacl Autonoma Mexico, Inst Invest Mat, Circuito Exterior S-N, Mexico City 04510, DF, Mexico
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