Effect of acetic acid and water content in the spray solution on structural, morphological, optical and electrical properties of Al and In co-doped zinc oxide thin films


Por: Jayaraman V.K., Álvarez A.M., Bizarro M., Amador M.L.O.

Publicada: 1 sep 2018
Resumen:
Aluminium and indium co-doped zinc oxide (AIZO) thin films were deposited using ultrasonic spray pyrolysis. Depositions were performed by varying the acetic acid and water content in the spraying solution which resulted in the formation of different nanostructures like hexagons, flowers, chisels, curved nanostructures, hexagonal pyramids, super grown hexagons, and inter-connected nanostructures. Further, the physical properties such as structural, optical, electrical, and surface texture parameters were examined. The structural studies showed that films were of crystalline nature, with different crystallite sizes and grown with a preferential orientation along (002) plane. The optical transmittance assessments proved that films were highly transparent (> 80%) in the visible region. The electrical sheet resistance was found to be in the range 29–1K O/?. Surface parameters like average roughness, root mean square roughness, and peak-valley height values helped to understand the homogeneity of the thin films. Finally, the suitability of AIZO films for transparent conductive oxide applications were tested by estimating the figure of merit (FOM). Among the different solution conditions, films fabricated using a starting solution containing 25 ml of acetic acid and 25 ml of water exhibited the lowest resistivity (2.47 ± 0.03 × 10-3 O-cm) along with the highest FOM (5.83 ± 0.42 × 10-3/O). © 2018, Springer Science+Business Media, LLC, part of Springer Nature.

Filiaciones:
Jayaraman V.K.:
 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Mexico City, Mexico

Álvarez A.M.:
 Departamento de Ingeniería Eléctrica-Sección de Estado Electrónico Sólido, Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Mexico City, Mexico

Bizarro M.:
 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Mexico City, Mexico

Amador M.L.O.:
 Departamento de Ingeniería Eléctrica-Sección de Estado Electrónico Sólido, Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Mexico City, Mexico
ISSN: 09574522
Editorial
Kluwer Academic Publishers, VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS, Países Bajos
Tipo de documento: Article
Volumen: 29 Número: 18
Páginas: 15321-15328
WOS Id: 000444200300007

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