Preferential orientation in bismuth thin films as a function of growth conditions


Por: Rodil S.E., Garcia-Zarco O., Camps E., Estrada H., Lejeune M., Bourja L., Zeinert A.

Publicada: 31 ago 2017
Resumen:
Bismuth thin films are known to exhibit interesting properties that can be explored for new applications such as optical or electrical sensors and thermoelectric devices. Due to the large anisotropy of the electronic band structure of Bi, its conductivity and optical functions are largely dependent on the preferred orientation obtained for the polycrystalline thin films, which are determined by the deposition system and the parameters. In this study we report on the growth of bismuth thin films deposited by various deposition methods, all of them starting from the vapor phase but with different energies associated to the impinging species: thermal and electron beam evaporation, direct and alternating current magnetron sputtering, and pulsed laser evaporation. It is shown that the texture developed in Bi thin films follows a competitive growth texture in which the crystallographic planes with lower surface energy are favored and this process is dominant unless enough energy is supplied either by substrate heating or high energy bombardment. (C) 2017 Elsevier B.V. All rights reserved.

Filiaciones:
Rodil S.E.:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, CU, Circuito Exterior S-N, Mexico City 04510, DF, Mexico

 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Mexico, Circuito Exterior s/n, CU, México D.F., 04510, Mexico

Garcia-Zarco O.:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, CU, Circuito Exterior S-N, Mexico City 04510, DF, Mexico

 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Mexico, Circuito Exterior s/n, CU, México D.F., 04510, Mexico

Camps E.:
 Inst Nacl Invest Nucl, Dept Fis, Apartado Postal 18-1027, Mexico City 11801, DF, Mexico

 Departamento de Física, Instituto Nacional de Investigaciones Nucleares, Apartado Postal 18-1027, México D.F., 11801, Mexico

Estrada H.:
 Ctr Ingn & Desarrollo Ind, Av Playa Pie de la Cuesta 702, Santiago De Queretaro 7612, Qro, Mexico

 Centro de Ingeniería y Desarrollo Industrial, Av. Playa Pie de la Cuesta No. 702, Desarrollo San Pablo, Santiago de Querétaro, Qro 7612, Mexico

Lejeune M.:
 Univ Picardie Jules Verne, Lab Phys Mat Condensee, 33 Rue St Leu, F-80039 Amiens, France

 Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, Amiens, 80039, France

Bourja L.:
 Univ Picardie Jules Verne, Lab Phys Mat Condensee, 33 Rue St Leu, F-80039 Amiens, France

 Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, Amiens, 80039, France

Zeinert A.:
 Univ Picardie Jules Verne, Lab Phys Mat Condensee, 33 Rue St Leu, F-80039 Amiens, France

 Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, Amiens, 80039, France
ISSN: 00406090
Editorial
ELSEVIER SCIENCE SA, PO BOX 564, 1001 LAUSANNE, SWITZERLAND, Suiza
Tipo de documento: Article
Volumen: 636 Número:
Páginas: 384-391
WOS Id: 000408037800055

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