Optical properties of ceria-zirconia epitaxial films grown from chemical solutions
Por:
Peña-Rodríguez O., Sánchez-Valdés C.F., Garriga M., Alonso M.I., Obradors X., Puig T.
Publicada:
1 ene 2013
Resumen:
Epitaxial thin films of ceria-zirconia solid solutions were grown on yttria-stabilized zirconia (YSZ) substrates by chemical solution deposition. Characterization by X-ray diffraction, atomic force microscopy and variable angle spectroscopic ellipsometry show that high-quality, epitaxial, high density films, with a thickness in the range of 20-27 nm were obtained. Compositional dependence of the film optical constants (n and k) was determined from ellipsometry measurements. It was found that the optical properties for the mixed-oxide films smoothly vary between the values for the pure oxides and are best described by means of a Tauc-Lorentz (TL) model. Moreover, we found that the parameters of the TL model have a linear dependence on the cerium concentration. The obtained results can serve as a database for the thickness, composition and porosity characterization of CexZr 1-xO2 thin films. © 2013 Elsevier B.V. All rights reserved.
Filiaciones:
Peña-Rodríguez O.:
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, Barcelona 08193, Spain
Centro de Microanálisis de Materiales (CMAM), Universidad Autónoma de Madrid (UAM), Cantoblanco, Madrid 28049, Spain
Instituto de Óptica, Consejo Superior de Investigaciones Científicas (IO-CSIC), C/Serrano 121, Madrid 28006, Spain
Sánchez-Valdés C.F.:
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, Barcelona 08193, Spain
Garriga M.:
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, Barcelona 08193, Spain
Alonso M.I.:
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, Barcelona 08193, Spain
Obradors X.:
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, Barcelona 08193, Spain
Puig T.:
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, Barcelona 08193, Spain
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