Real-time studies during coating and post-deposition annealing in organic semiconductors
Por:
Campoy-Quiles M., Schmidt M., Nassyrov D., Peña O., Goñi A.R., Alonso M.I., Garriga M.
Publicada:
1 ene 2011
Resumen:
In this contribution we explore the use of real time spectroscopic probes to gain useful insights into the kinetics of semiconductor polymer chains during thin film formation and upon post-deposition annealing treatments. In-situ ellipsometry is employed to monitor the deposition of thin films of the workhorse material system for organic photovoltaics (soluble derivative fullerene blended with poly(3-hexylthiophene)), when processed from solution using an analogous dip coating deposition method. This allows for detailed time investigation of the dynamics of film formation. Moreover, we applied spectroscopic photometry to study the in-situ crystallization and diffusion of polymer chains during post-deposition solvent annealing. © 2010 Elsevier B.V. All rights reserved.
Filiaciones:
Campoy-Quiles M.:
Institute of Materials Science of Barcelona (ICMAB-CSIC), Campus de la Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
Schmidt M.:
Institute of Materials Science of Barcelona (ICMAB-CSIC), Campus de la Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
Nassyrov D.:
Institute of Materials Science of Barcelona (ICMAB-CSIC), Campus de la Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
Peña O.:
Institute of Materials Science of Barcelona (ICMAB-CSIC), Campus de la Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
Goñi A.R.:
Institute of Materials Science of Barcelona (ICMAB-CSIC), Campus de la Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
Alonso M.I.:
Institute of Materials Science of Barcelona (ICMAB-CSIC), Campus de la Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
Garriga M.:
Institute of Materials Science of Barcelona (ICMAB-CSIC), Campus de la Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
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