Thermal behaviour of chitosan and chitin thin films studied by spectroscopic ellipsometry


Por: Montiel-González Z., Luna-Bárcenas G., Mendoza-Galván A.

Publicada: 1 ene 2008
Categoría: Condensed Matter Physics

Resumen:
In-situ spectroscopic ellipsometry was used to evaluate the temperature behaviour of chitin and chitosan thin films. For both biopolymers it was found that film thickness decreases with temperature. Two different linear rates were clearly identified by a characteristic temperature Tc, of 51 and 59 °C for chitin and chitosan, respectively. However, the refractive index for chitin decreases with temperature and a more complex behaviour was found for chitosan. The results of this work show that a more complex transformation than water desorption should be claimed to explain the observations. (Graph Presented). © 2008 Wiley-VCH Verlag GmbH & Co. KGaA.

Filiaciones:
Montiel-González Z.:
 Cinvestav-Querétaro, Libramiento Norponiente 2000, Frac. Real de Juriquilla, Querétaro, 76230, Mexico

Luna-Bárcenas G.:
 Cinvestav-Querétaro, Libramiento Norponiente 2000, Frac. Real de Juriquilla, Querétaro, 76230, Mexico

Mendoza-Galván A.:
 Cinvestav-Querétaro, Libramiento Norponiente 2000, Frac. Real de Juriquilla, Querétaro, 76230, Mexico
ISSN: 18626351
Editorial
Wiley-VCH Verlag, PAPPELALLEE 3, W-69469 WEINHEIM, GERMANY, Alemania
Tipo de documento: Conference Paper
Volumen: 5 Número: 5
Páginas: 1434-1437
WOS Id: 000256862500105

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