GISAXS size distribution characterization of Cu nanoparticles embedded in silica
Por:
Peña-Rodríguez O., Rodríguez-Fernández L., Rodríguez-Iglesias V., Kellermann G., Crespo-Sosa A., Cheang-Wong J.C., Arenas-Alatorre J., Oliver A.
Publicada:
1 ene 2009
Categoría:
Physics and Astronomy (miscellaneous)
Resumen:
Cu nanoparticles embedded in high purity silica produced by deep ion implantation at 2 MeV and located around 0.8 µm underneath the surface were analyzed by GISAXS and TEM. Same results were obtained by both techniques, indicating that GISAXS is a reliable method for shape and size characterization of metallic nanoclusters underneath the surface of a silica matrix. The Cu nanoparticles presented a nearly-spherical shape with a mean radius around 3 ± 1.2 nm. © 2009 American Institute of Physics.
Filiaciones:
Instituto de Investigaciones en Materiales, Universidad National Autónoma de México, Apartado Postal 70-360, MéxicoD.F., 04510, Mexico
Instituto de Física, Universidad National Autónoma de México, Apartado Postal 20-364, Mexico, D.F., 01000, Mexico
Instituto de Física, UNAM, A.P. 20-364, Mexico, D.F. 01000, Mexico
Laboratório National de Luz Sincrotron CP 6192, 13084-971 Campinas, SP, Brazil
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