Structure and morphology of films of pm-Si:H grown by PECVD varying dichlorosilane with hydrogen dilution and working pressure


Por: Alvarez-Macias, C, Santoyo-Salazar, J, Monroy, BM, Garcia-Sanchez, MF, Picquart, M, Ponce, A, Contreras-Puente, G, Santana, G

Publicada: 1 jun 2011
Categoría: Physics and Astronomy (miscellaneous)

Resumen:


Filiaciones:
Alvarez-Macias, C:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Mexico City 04510, DF, Mexico

Santoyo-Salazar, J:
 Inst Politecn Nacl, Ctr Invest & Estudios Avanzados, Dept Fis, Mexico City 07000, DF, Mexico

Monroy, BM:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Mexico City 04510, DF, Mexico

Garcia-Sanchez, MF:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Mexico City 04510, DF, Mexico

 Univ Autonoma Metropolitana Iztapalapa, Dept Fis, Mexico City 09340, DF, Mexico

Ponce, A:
 Univ Texas San Antonio, Dept Phys & Astron, Kleberg Adv Elect Microscopy Ctr, San Antonio, TX 78249 USA

Contreras-Puente, G:
 Inst Politecn Nacl, UPALM, Escuela Super Fis & Matemat, Mexico City 07738, DF, Mexico

Santana, G:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Mexico City 04510, DF, Mexico

 Inst Politecn Nacl, UPALM, Escuela Super Fis & Matemat, Mexico City 07738, DF, Mexico
ISSN: 0035001X





REVISTA MEXICANA DE FISICA
Editorial
SOC MEXICANA FISICA, APARTADO POSTAL 70-348, COYOACAN 04511, MEXICO, México
Tipo de documento: Article
Volumen: 57 Número: 3
Páginas: 224-231
WOS Id: 000291963000008

MÉTRICAS