Visible electroluminescence from silicon nanoclusters embedded in chlorinated silicon nitride thin films


Por: Alonso, JC, Pulgarin, FA, Monroy, BM, Benami, A, Bizarro, M, Ortiz, A

Publicada: 3 may 2010
Resumen:
Visible electroluminescence (EL) has been obtained from devices with active layers of silicon nanocrystals embedded in chlorinated silicon nitride (Si-nc/SiN(x):Cl) thin films, deposited by remote plasma enhanced chemical vapour deposition, using SiCl(4)/NH(3)/H(2)/Ar. The active nc-Si/SiN(x):Cl film was sandwiched between Al contacts and a transparent conductive contact of ZnO(x):Al deposited by the pyrosol process. White EL centred at around 600 nm was observed, with a turn-on voltage of 5 V, and the intensity increasing as a function of voltage. Recombination between electron-hole pairs generated in the Si-nc by electron impact ionization is proposed as the EL mechanism. (C) 2009 Elsevier B.V. All rights reserved.

Filiaciones:
Alonso, JC:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Coyoacan 04510, DF, Mexico

Pulgarin, FA:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Coyoacan 04510, DF, Mexico

Monroy, BM:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Coyoacan 04510, DF, Mexico

Benami, A:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Coyoacan 04510, DF, Mexico

Bizarro, M:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Coyoacan 04510, DF, Mexico

Ortiz, A:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Coyoacan 04510, DF, Mexico
ISSN: 00406090





Thin Solid Films
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Tipo de documento: Article
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WOS Id: 000278064600053

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