Enhanced speckle microstrain measurements in PDMS doped with SiO2 nanoparticles
Por:
Briones C., Hernández-Suárez A., Cuando-Espitia N., Hernández-Cordero J., Sánchez-Arévalo F.M.
Publicada:
1 ene 2011
Resumen:
Measurements of microstrain levels in PDMS membranes doped with SiO2 nanoparticles were obtained using digital image correlation (DIC). The mechanical behavior of PDMS can be analyzed using the enhanced speckle pattern obtained from the samples. © OSA/ANIC/IPR/Sensors/SL/SOF/SPPCom/2011.
Filiaciones:
Instituto de Investigaciones en Materiales, UNAM, Universitaria, México, Apdo. Postal 70-360, Cd, D.F., 04510, Mexico
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