Spectroscopic ellipsometry characterization of Er3+-doped titania thin films prepared by the sol-gel method
Por:
Palomino-Merino R., Mendoza-Galván A., Martínez G., Castaño V., Rodríguez R.
Publicada:
1 ene 2001
Resumen:
Titania thin films prepared by the sol-gel method were optically characterized by spectroscopic ellipsometry. These films were doped with Er3+ and supported on silicon wafers chemically activated by using the dipping method. The dielectric function was modeled using the Forouhi-Bloomer model, which provides also the refractive index and the thickness of the film.
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