Simple method for evaluating plano-convex aspherical lenses
Por:
Huerta-Carranz O., Campos-García M., Granados-Agustín F.S., Santiago-Alvarad A., Rodríguez A.C., Avendaño-Alejo M.
Publicada:
1 ene 2023
Resumen:
Nowadays, optical systems commonly use either aspheric or free-form surfaces to improve their performance; however, to ensure that the manufactured surfaces become successful in concordance with to the nominal design, some geometrical parameters such as radius of curvature, conic constant, aspheric coefficients, etc., must be measured, including the surface shape under test. In this work, we propose a simple method to evaluate the optical quality of a plano-convex aspheric lens, where the convex face is modeled as an aspheric or free-form surface. We design a non-uniform pattern on the plane face of the plano-convex lens, to obtain a uniform pattern on a predefined detection plane by using the law of refraction in vector form. Additionally, implementing numerical simulations, we calculate the synthetic images produced through a predefined optical surface that we will use as if they were obtained from an experimental test. Finally, we apply an iterative method to retrieve the shape of the surface by using the normal vector field to demonstrate the feasibility of our proposal. © 2023 SPIE.
Filiaciones:
Huerta-Carranz O.:
Instituto Nacional de Astrofísica, Óptica y Electronica, Apdo. Postal 216, Pue., Puebla, C.P. 72000, Mexico
Campos-García M.:
Instituto de Ciencias Aplicadas y Tecnología, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Ciudad Universitaria, Mexico City, 04510, Mexico
Granados-Agustín F.S.:
Instituto Nacional de Astrofísica, Óptica y Electronica, Apdo. Postal 216, Pue., Puebla, C.P. 72000, Mexico
Santiago-Alvarad A.:
Instituto Nacional de Astrofísica, Óptica y Electronica, Apdo. Postal 216, Pue., Puebla, C.P. 72000, Mexico
Postgraduate Studies Division, Technological University of the Mixteca, Carretera a Acatlima km 2.5, Huajuapan de León, Oaxaca, C. P. 69000, Mexico
Rodríguez A.C.:
Instituto Nacional de Astrofísica, Óptica y Electronica, Apdo. Postal 216, Pue., Puebla, C.P. 72000, Mexico
Avendaño-Alejo M.:
Instituto de Ciencias Aplicadas y Tecnología, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Ciudad Universitaria, Mexico City, 04510, Mexico
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