System for electrical characterization in semiconductors for application in solar cells


Por: Reyes-Duran B., Alvarez-Macias C., Salgado-Conrado L., Frayre-Hernandez M., Hernandez-Jacobo C., Garcia-Cantor J.

Publicada: 1 ene 2021
Resumen:
This work describes a made home system for measuring electrical properties in solar cells and semiconductor material for photovoltaic application, in an environment with low electrical noise and controlled radiation. It consists of a Faraday cage connected to a source measuring unit (SMU) KEITHLEY 2450, which gets the characteristic curve in solar cells and the resistivity in thin sheets of semiconductor material. The system includes a halogen lamp that allows taking measurements at controlled irradiation. As preliminary results, we have obtained ?-V curves for solar cells and thin film resistivity at different temperatures in the same system. © 2021 IEEE.

Filiaciones:
Reyes-Duran B.:
 Tecnológico Nacional de México, Instituto Tenológico de la Laguna, Torreón, Mexico

Alvarez-Macias C.:
 Tecnológico Nacional de México, Instituto Tenológico de la Laguna, Torreón, Mexico

Salgado-Conrado L.:
 Universidad Autónoma de Coahuila, Facultad de Ingeniería Mecánica y Eléctrica, Torreón, Mexico

Frayre-Hernandez M.:
 Universidad Autónoma de Coahuila, Facultad de Ingeniería Mecánica y Eléctrica, Torreón, Mexico

Hernandez-Jacobo C.:
 Tecnológico Nacional de México, Instituto Tenológico de la Laguna, Torreón, Mexico

Garcia-Cantor J.:
 Tecnológico Nacional de México, Instituto Tenológico de la Laguna, Torreón, Mexico
ISSN: 01608371
Editorial
IEEE, New York, NY, USA, 345 E 47TH ST, NEW YORK, NY 10017 USA, Estados Unidos America
Tipo de documento: Conference Paper
Volumen: Número:
Páginas: 101-103
WOS Id: 000701690400024