Conical etched ion tracks in SiO2 characterised by small angle X-ray scattering
Por:
Hadley A., Notthoff C., Mota-Santiago P., Hossain U.H., Mudie S., Toimil-Molares M.E., Trautmann C., Kluth P.
Publicada:
1 ene 2018
Resumen:
We present a systematic study of the evolution of chemically etched ion tracks formed in thermally grown a-SiO2 after irradiation with 1.1 GeV and 185 MeV Au ions. The irradiated material was subsequently etched with 2.5% hydrofluoric acid (HF) for different times yielding hollow conical shaped structures of various sizes. The characterisation of these structures was carried out by synchrotron-based small-angle X-ray scattering (SAXS) measurements, enabling the determination of the geometry and dimensions of the etched conical structures with sub-nanometre precision. The results indicate that the track etching behavior is influenced by the ion energy, and that at short etching times the latent track damage in the radial direction becomes significant. © 2017 Elsevier B.V.
Filiaciones:
Hadley A.:
Research School of Physics and Engineering, Australian National University, Canberra, ACT 2601, Australia
Notthoff C.:
Research School of Physics and Engineering, Australian National University, Canberra, ACT 2601, Australia
Mota-Santiago P.:
Research School of Physics and Engineering, Australian National University, Canberra, ACT 2601, Australia
Hossain U.H.:
Research School of Physics and Engineering, Australian National University, Canberra, ACT 2601, Australia
Mudie S.:
Australian Synchrotron, 800 Blackburn Rd, Clayton, VIC 3168, Australia
Toimil-Molares M.E.:
GSI Helmholzzentrum für Schwerionenforschung, Plankstrasse 1, Darmstadt, 64291, Germany
Trautmann C.:
GSI Helmholzzentrum für Schwerionenforschung, Plankstrasse 1, Darmstadt, 64291, Germany
Technische Universität Darmstadt, Darmstadt, 64289, Germany
Kluth P.:
Research School of Physics and Engineering, Australian National University, Canberra, ACT 2601, Australia
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