Optical characterization of titania thin films produced by the solgel method and doped with Co2+ at different concentrations
Por:
Pacheco F., Palomino R., Martínez G., Mendoza-Galván A., Talavera R.R., Castaño V.M.
Publicada:
1 ene 1998
Resumen:
We report some preliminary results on the fabrication and optical characterization of high-refractiveindex thin films of titania doped with Co2+. These films were supported on silica plates that were chemically activated to attach both phases. The titania films were produced by the solgel method at room temperature and slowly annealed from room temperature to 230°C; their thickness was approximately 600Å. The optical characterizations were obtained by the use of spectroscopic ellipsometry, where the dielectric function of the material was obtained as a function of the wavelength. Additionally, the ellipsometric function was modeled to obtain the porosity of the films and their thickness. © 1998 Optical Society of America.
Filiaciones:
Pacheco F.:
Departamento de Física, Universidad Popular Autónoma del Estado de Puebla, 21 Sur 1103 Pue, Puebla, 72160, Mexico
Departamento de Física, Universidad Autónoma Metropolitana-Iztapalapa, Apdo Postal 55-534, 09340, Mexico
Palomino R.:
Departamento de Física, Universidad Popular Autónoma del Estado de Puebla, 21 Sur 1103 Pue, Puebla, 72160, Mexico
Departamento de Física, Universidad Autónoma Metropolitana-Iztapalapa, Apdo Postal 55-534, 09340, Mexico
Martínez G.:
Instituto de Física, Universidad Autónoma de Puebla, Apdo. Postal J-48, Puebla, 72750, Mexico
Mendoza-Galván A.:
Instituto de Física, Universidad Autónoma de Puebla, Apdo. Postal J-48, Puebla, 72750, Mexico
Talavera R.R.:
Departamento de Física, Universidad Autónoma Metropolitana-Iztapalapa, Apdo. Postal 55-534, 09340, Mexico
Castaño V.M.:
Instituto de Física, Universidad Nacional Autónoma de Mexico, Apdo. Postal 1-1010, Querétaro, 76001, Mexico
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