Impact of Resistive Superconducting Fault Current Limiter and Distributed Generation on Fault Location in Distribution Networks


Por: Guillen, Daniel, Salas, Christian, Trillaud, Frederic, Castro, Luis M., Queiroz A.T., Sotelo G.G.

Publicada: 1 ene 2020
Resumen:
Resistive Superconducting Fault-Current limiters (r-SFCL) appear as a new attractive technology to address faults in power grids. Based on a new generation of superconductors, referred to as High-Temperature Superconductors (HTS), they could offer economical benefits compared to more conventional technologies. To understand their impact on the electrical networks, two models of r-SFCL, differing by their complexity, were built to conduct short-circuit analysis. Different fault locations in distribution networks were studied in the standard IEEE 13-node and 34-node test feeders. Both models were validated against experimental data and then cross-checked in the IEEE 13-bus distribution system to determine their relative accuracy when used in practical power grids. Subsequently, using the simplest electrical model of r-SFCL, the 34-bus test system incorporating Distributed Generation (DG) was used to analyze short circuits. It was found that the presence of r-SFCL increases the error of the fault location algorithm. However, it was also demonstrated that a single r-SFCL enables the incorporation of several additional DG in a distribution network by reducing the fault current level by at least 45% depending on its design characteristics and the number of added DG. Finally, an improved algorithm is presented. This algorithm takes into account the r-SFCL resistance in order to reduce the fault location error. © 2020 Elsevier B.V.

Filiaciones:
Guillen, Daniel:
 Escuela de Ingeniería y Ciencias, Tecnologico de Monterrey, Nuevo León, 64849, Mexico

 Tecnol Monterrey, Escuela Ingn & Ciencias, Monterrey 64849, Nuevo Leon, Mexico

Salas, Christian:
 Posgrado en Ingeniería Eléctrica, Universidad Nacional Autónoma de México, CDMX 04510, Mexico

 Univ Nacl Autonoma Mexico, Posgrad Ingn Elect, Cdmx 04510, Mexico

Trillaud, Frederic:
 Instituto de Ingenier00EDía, Universidad Nacional Autónoma de México, CDMX 04510, Mexico

 Univ Nacl Autonoma Mexico, Inst Ingn, Cdmx 04510, Mexico

Castro, Luis M.:
 Departamento de Energía Eléctrica, Universidad Nacional Autónoma de México, CDMX 04510, Mexico

 Univ Nacl Autonoma Mexico, Dept Energia Elect, Cdmx 04510, Mexico

Queiroz A.T.:
 Electrical Engineering Department, Fluminense Federal University, Niterói, Rio de Janeiro, 24220-900, Brazil

Sotelo G.G.:
 Electrical Engineering Department, Fluminense Federal University, Niterói, Rio de Janeiro, 24220-900, Brazil

Fluminense Fed Univ, Elect Engn Dept, BR-24220900 Niteroi, RJ, Brazil
ISSN: 03787796
Editorial
Elsevier Ltd, PO BOX 564, 1001 LAUSANNE, SWITZERLAND, Suiza
Tipo de documento: Article
Volumen: 186 Número:
Páginas:
WOS Id: 000541722200028