Requirements and applications of accurate modeling of the optical transmission of transparent conducting coatings


Por: Juarez-Garcia, Benito, Gonzalez-Gutierrez, Jesus, Judith Rivera-Medina, Martha, Garcia-Valenzuela, Augusto, Carlos Alonso-Huitron, Juan

Publicada: 1 jul 2019
Resumen:
A comprehensive model for the optical transmission is constructed and used to investigate the requirements for fitting accurately the experimental data of the optical transmittance at normal incidence of transparent conducting coatings of ZnO:Al deposited on glass substrates by ultrasonic spray pyrolysis. The model takes into account the Urbach tail absorption edge at the low wavelength region, the contribution of free carrier concentration to the weak absorption in the visible and near-infrared ranges, and the effect of scattering of light originated by the surface roughness of the films. The carrier concentration of the ZnO:Al films was measured experimentally by the Hall effect and dc-electrical conductivity measurements in the Van der Paw configuration. It is shown that all mentioned physical effects must be included in order to fit accurately the transmittance spectrum in the VIS-NIR spectral window. The full expression for the optical transmittance was used for choosing the optimal thickness of these films as transparent conductive contacts and the calculation of the figure of merit. (C) 2019 Optical Society of America

Filiaciones:
Juarez-Garcia, Benito:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Apartado Postal 70-360, Coyoacan 04510, Mexico

 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Apartado Postal 70-360, Coyoacán, Distrito Federal 04510, Mexico

Gonzalez-Gutierrez, Jesus:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Apartado Postal 70-360, Coyoacan 04510, Mexico

 Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Apartado Postal 70-360, Coyoacán, Distrito Federal 04510, Mexico

Judith Rivera-Medina, Martha:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Apartado Postal 70-360, Coyoacan 04510, Mexico

Garcia-Valenzuela, Augusto:
 Univ Nacl Autonoma Mexico, Inst Ciencias Aplicadas & Tecnol, Apartado Postal 70-186, Coyoacan 04510, Mexico

 Instituto de Ciencias Aplicadas y Tecnología, Universidad Nacional Autónoma de México, Apartado Postal 70-186, Coyoacán, Distrito Federal 04510, Mexico

Carlos Alonso-Huitron, Juan:
 Univ Nacl Autonoma Mexico, Inst Invest Mat, Apartado Postal 70-360, Coyoacan 04510, Mexico
ISSN: 1559128X
Editorial
Optical Society of American (OSA), 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA, Estados Unidos America
Tipo de documento: Article
Volumen: 58 Número: 19
Páginas: 5179-5186
WOS Id: 000473324200007
ID de PubMed: 31503612