Thickness dependence of infrared reflectance of ultrathin metallic films: Influence of quantum confinement
Por:
Villagomez, Ricardo, Xiao, Mufei
Publicada:
1 ene 2016
Resumen:
In this letter we discuss experimental results on optical reflectance of ultrathin metallic films. The laser light source was tuned at the infrared wavelength of ?=9.2µm. Three metals were tested: aluminum, niobium, and nickel. The thin films were coated on various wafers, namely, fused glass, a-quartz and amorphous silicon, with the technique of magnetic field assisted sputtering modulated at radio frequencies. The infrared reflectance was recorded while the thickness of the film varied from 5 to little more than 100 Å. A phenomenon is observed, i.e. a periodic oscillation appeared modulated on the otherwise classic thickness dependence of metallic films. The effects are attributed to the influence of quantum confinement induced intraband redistribution of conduction electrons. A one-dimensional quantum well model was employed to simulate the system, and the numerical results confirmed the existence of the quantum size effect. © 2016 Elsevier GmbH. All rights reserved.
Filiaciones:
Villagomez, Ricardo:
Ctr Invest Cient & Educ Super Ensenada, 3918 Carretera Tijuana Ensenada, Ensenada 22860, Baja California, Mexico
Univ Nacl Autonoma Mexico, Ctr Nanociencias & Nanotecnol, Km 107 Carretera Tijuana Ensenada, Ensenada 22860, Baja California, Mexico
Xiao, Mufei:
Univ Nacl Autonoma Mexico, Ctr Nanociencias & Nanotecnol, Km 107 Carretera Tijuana Ensenada, Ensenada 22860, Baja California, Mexico
|