Theoretical assessment of optical reflectometry for film chemical-sensors


Por: Garcia-Valenzuela Augusto, Saniger J.M., Garcia-Segundo C.

Publicada: 1 ene 1998
Resumen:
We investigate theoretically the limit to the resolution imposed by the fundamental optical noises in film-based chemical sensors interrogated by optical reflectometry. We suggest a dynamic reflectometry approach as a possible technique to achieve the ultimate resolution. We find that a theoretical resolution around 1010 absorbed analyte molecules/cm2 is possible in different cases. In the case of conducting films appreciably lower values may be possible.

Filiaciones:
Garcia-Valenzuela Augusto:
 Universidad Nacional Autonoma de, Mexico, Mexico, Mexico

Saniger J.M.:
 Universidad Nacional Autonoma de, Mexico, Mexico, Mexico

Garcia-Segundo C.:
 Universidad Nacional Autonoma de, Mexico, Mexico, Mexico
ISSN: 0277786X
Editorial
SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, Estados Unidos America
Tipo de documento: Conference Paper
Volumen: 3491 Número:
Páginas: 788-793

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