A macroscopic approach to near-field optical microscopy


Por: Wang S., Xiao M., Siqueiros J.

Publicada: 1 ene 1996
Resumen:
A macroscopic theory for scanning optical near field microscopy is presented. The theory, based upon the Rayleigh method, solves rigorously the electromagnetic field near a multilayer system with arbitrary one-dimension structure on its interfaces. The method is suitable for both s- and p-polarized incident light. It may also apply in cases where the resonances in the system, such as the plasmon in a metallic sample, become important.

Filiaciones:
Wang S.:
 Institute de Física, Universidad Nacional Autónoma de México, Apartado Postal 2681, Ensenada, BC, 22800, Mexico

Xiao M.:
 Institute de Física, Universidad Nacional Autónoma de México, Apartado Postal 2681, Ensenada, BC, 22800, Mexico

Siqueiros J.:
 Institute de Física, Universidad Nacional Autónoma de México, Apartado Postal 2681, Ensenada, BC, 22800, Mexico
ISSN: 09500340
Editorial
Taylor & Francis Ltd, London, United Kingdom, 4 PARK SQUARE, MILTON PARK, ABINGDON OX14 4RN, OXON, ENGLAND, Reino Unido
Tipo de documento: Article
Volumen: 43 Número: 10
Páginas: 2119-2127