New method for sub-structured Ronchi rulings generation and his irradiance profile


Por: Aguirre-Aguirre D., Granados-Agustín F.S., Villalobos-Mendoza B., Izazaga-Pérez R., Campos-García M., Cornejo-Rodríguez A.

Publicada: 1 ene 2013
Resumen:
In this work we show a new technique for sub-structured Ronchi rulings generation and the calculation of the irradiance profile produced by this ruling. Commonly, these rulings are used to increase the spatial resolution in the Ronchi test and allow us to observe smaller surface defects. To generate the sub-structured Ronchi ruling we propose a combination of several classical Ronchi rulings with different frequency, in order to calculate the irradiance profile generated by the substructured Ronchi ruling, we propose a combination of the irradiance profile generated by each combined classical Ronchi ruling. The comparison of synthetic and experimental Ronchigrams of spherical surfaces are shown. We found that the proposed method can reproduce reliably the experimental irradiance profile. © 2013 SPIE.

Filiaciones:
Aguirre-Aguirre D.:
 Departamento de Óptica, Instituto Nacional de Astrofísica, Óptica y Electrónica, INAOE, Apdo. Postal 51 and 216, C. P. 72000, Puebla, Pue., Mexico

Granados-Agustín F.S.:
 Departamento de Óptica, Instituto Nacional de Astrofísica, Óptica y Electrónica, INAOE, Apdo. Postal 51 and 216, C. P. 72000, Puebla, Pue., Mexico

Villalobos-Mendoza B.:
 Departamento de Óptica, Instituto Nacional de Astrofísica, Óptica y Electrónica, INAOE, Apdo. Postal 51 and 216, C. P. 72000, Puebla, Pue., Mexico

Izazaga-Pérez R.:
 Departamento de Óptica, Instituto Nacional de Astrofísica, Óptica y Electrónica, INAOE, Apdo. Postal 51 and 216, C. P. 72000, Puebla, Pue., Mexico

Campos-García M.:
 Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Universidad Nacional Autónoma de Mexico, CCADET-UNAM, Apdo. Postal 70-186, 04510, D.F. Mexico, Mexico

Cornejo-Rodríguez A.:
 Departamento de Óptica, Instituto Nacional de Astrofísica, Óptica y Electrónica, INAOE, Apdo. Postal 51 and 216, C. P. 72000, Puebla, Pue., Mexico
ISSN: 0277786X
Editorial
SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, Estados Unidos America
Tipo de documento: Conference Paper
Volumen: 8785 Número:
Páginas:
WOS Id: 000328616100116