L2,3 edge of silicon: Theory and experiment


Por: Aebi P., Keller J., Erbudak M., Vanini F.

Publicada: 1 ene 1988
Resumen:
Structures in the electron-energy-loss spectrum up to 30 eV above the L2,3 edge of clean silicon, excited with high- and low-energy electrons, are found to be in good agreement with a multiple-scattering calculation of the empty density of states of a tetrahedral cluster of 17 silicon atoms. The relaxation of the excited atom is investigated by means of the emission spectrum. The decay channels involving electrons in resonant scattering states produce high-energy satellites to the conventional Auger transition in accordance with the excitation spectrum. © 1988 The American Physical Society.
ISSN: 01631829





PHYSICAL REVIEW B
Editorial
American Physical Society, ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA, Estados Unidos America
Tipo de documento: Article
Volumen: 38 Número: 8
Páginas: 5392-5396
WOS Id: A1988Q117000025
ID de PubMed: 9946977